Connectivity for semiconductor test and measurement.
There’s a lot riding on your choice of cables, connectors and cable assemblies for equipment that tests and measures semiconductor chip performance. Even a small failure can be costly. 3M provides durable, high-flex cables and a broad range of connectors for the latest ATE platforms, wafer-level testing, metrology and more. Our portfolio offering of connectivity solutions for the semiconductor industry help you consistently offer the highest-performing and most reliable equipment, with forward-thinking features that you can’t find anywhere else.
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Solutions for your needs.
For evaluating semiconductor performance, you can’t afford to get it wrong.
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Maximizing board space
Semiconductor test and measurement depends on high-density sensor-signal design. That means fitting more components into the same, or less, PCB space. With options like 3M cable socket 451 and 3M header 452 Series that are half the pitch of the industry-standard .100” connectors. For compact connectors for 2-4 wire sensor and signal applications, our 3M™ Mini-Clamp Connectors have a compact footprint, while 3M™ Mini Stack headers and sockets can help reduce board footprint even further.
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Solutions for high-flex motion
Dynamic applications such as probe stations, pick-and-place, AVI and CD metrology demand connectivity solutions that can withstand long-term varied or repetitive motion. 3M offers durable high-flex cabling solutions for machine vision including CoaXPress® compatible cable assemblies flex-cycle tested to 45 million cycles, and USB3 Vision® compatible cable assemblies tested up to 100 million cycles. We also provide high-flex flat ribbon cables for I/O and data applications with options from 1- 100 million flex cycles.
The right connectivity can help you keep your equipment operating at maximum throughput, even figuring in ongoing maintenance and upgrades. Compact, field-installable IDC connectors from 3M allow technicians to terminate three or four wires in a single motion. That means:
- Up to 80% less wiring time compared to crimp-style connectors
- One-hand mating and un-mating for faster field maintenance
- Add signal/sensor network components in less time
3M invented IDC in 1961. Choose long-term expertise and a commitment to innovation for the future of mission-critical robotics.
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Solid vibration solutions
3M™ Molded-On Cable Assemblies feature a rugged, one-piece design for outstanding protection from vibration and maximum electrical performance, fully customized to your specifications. Strong beryllium copper contacts stand up to repeated insertions and withdrawals. Integral strain relief and closed connector ends provide a space-saving lower height profile.
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Semiconductor test and measurement equipment products
View more detailed information about 3M interconnect solutions for semiconductor test and measurement, including cables, extremely durable cable assemblies and a range of connectors that saves space and time.
Why choose 3M?
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High-quality solutions3M connectors, cables and cable assemblies are built to help you meet your needs, from performance verification and quality control to efficient process optimization and system upgrades.
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Expertise3M application engineers are available to help solve some of the toughest design challenges.
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Experience3M has spent decades in interconnect and electronics, backed by a century of materials science.
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Support3M provides global manufacturing processes and local support.
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