Attribute Name
|
Value
|
---|---|
Abrasive Material
|
Nickel based alloy with patterned diamond
|
Abrasive Working Surface
|
Full Face
|
Application
|
CMP
|
Carrier Color
|
Gray
|
Carrier Diameter (Imperial)
|
3.74 in
|
Carrier Diameter (Metric)
|
95 mm
|
Carrier Format
|
Disk - double sided
|
Carrier Size
|
3.74 inch diameter
|
Carrier Substrate
|
304 SS
|
Diamond Size
|
74 um
|
Diamond Type
|
Type 2, blocky
|
Manufacturing Location
|
United States
|
Product Type
|
Diamond Pad Conditioner
|
Highly engineered pad conditioners deliver reliable performance for critical semiconductor CMP applications. Utilizes Sintered Abrasive Technology for excellent diamond retention, with controlled diamond placement and protrusion.
Refresh your CMP pad surfaces with 3M™ Diamond Pad Conditioners. They also minimize wear and maintain consistent asperities and consistent pad performance — for wafer after wafer. CMP pad conditioners from 3M utilize sintered abrasive technology for excellent diamond retention for longer life, with controlled diamond placement and protrusion. Their single-layered diamond grid with highly controlled spacing enables you to better predict and optimize your CMP pad usage, for better planarization efficiency.
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